Polycapillary X-Ray Optics for Liquid-Metal-Jet X-Ray Tubes

Sammanfattning: Investigating and mapping fundamental processes in nature is a driving force for breakthroughs in research and technology. Doing so, requires knowledge of the smallest scales of the world. One way of performing measurements on these scales is through intense x-ray sources, which have improved greatly over the last decades. By combing these sources with state of the art optics, even higher flux densities can be reached, allowing for faster measurements and ground-breaking discoveries.  This study aims to explore the performance of polycapillary optics, when aligned to one of the most intense x-ray micro sources in the world, the liquid-metal-jet D2+. Knife edge scans were performed together with a photon-counting medipix x-ray camera to quantify focus properties such as, flux, flux density, transmission, gain and beam width. Measurements were conducted with a 20 μm source spot that was compared to a simulated 200 μm source spot, both at 260 W electron beam power. The data from vertical and horizontal scans were combined to reconstruct the 2D functionality of the polycapillary optic. The flux density were almost four times higher with the 20 μm spot compared to the simulated 200 μm spot. This result correlated with the condition for total external reflection and the local divergence. The conclusion is that the small source spot of the liquid-metal-jet source improves the efficiency of the polycapillary optic.  The efficiency could still be improved, if the deviation in the pointing accuracy could be minimized. Furthermore, the combination of liquid-metal-jet x-ray source and the polycapillary optic, achieved extremely high flux densities. This was specially compared to an x-ray source used for confocal micro XRF, where the flux was almost nine times higher with the liquid-metal-jet x-ray source. This allows for faster measurements within confocal micro XRF and other techniques demanding very high flux densities, but with low demands on beam divergence and spectral purity.