Sökning: "1687"
Visar resultat 1 - 5 av 19 uppsatser innehållade ordet 1687.
1. On-chip Instrument Access Through System Hierarchy
Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknikSammanfattning : There are many advantages with the development towards Integrated Circuits (ICs) with smaller, faster, and more transistors. However, tighter margins lead to a need of on-chip instruments to test, tune, and configure. These on-chip instruments, which can be in the range of thousands per IC, must be accessed through the life-time. LÄS MER
2. External validation of a tool to assess medication-related admissions in four Swedish hospitals
Uppsats för yrkesexamina på avancerad nivå, Uppsala universitet/Avdelningen för farmakokinetik och läkemedelsterapiSammanfattning : External validation of a tool to assess medication-related admissions in four Swedish hospitals Background The MedBridge trial is a large ongoing clinical trial on medication reviews in elderly patients in Sweden with participating hospitals from Uppsala, Enköping, Västerås and Gävle. A tool for assessing medication-related admissions (MRAs) has been developed and validated in Uppsala: Assessment Tool for identifying Hospital Admissions Related to Medications (AT-HARM10). LÄS MER
3. För att undkomma Guds vrede : En studie om rättsliga processer rörande religionsbrott bland samer och påstådda häxor i Sverige 1668–1687
Kandidat-uppsats, Umeå universitet/Institutionen för idé- och samhällsstudierSammanfattning : .... LÄS MER
4. Test and Repair of Reconfigurable On-chip Instrument Access Networks
Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknikSammanfattning : As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become harder to avoid malfunctioning. Embedded instruments are increasingly used to test, tune, and configure the transistors in ICs. IEEE Std.1149. LÄS MER
5. Reconfigurable Instrument Access Network with a Functional Port Interface
Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknikSammanfattning : The ever-increasing need for higher performance and more complex functionality pushes the electronics industry to find a faster and more efficient way to test and debug an Integrated Circuit (IC). Currently, the IEEE Std. 1149.1, known as Joint Test Action Group (JTAG) is considered as state of the art by the industry. LÄS MER