Sökning: "BIST SRAM verification test self-test dual-port ASIC"

Hittade 1 uppsats innehållade orden BIST SRAM verification test self-test dual-port ASIC.

  1. 1. Integration of a Digital Built-in Self-Test for On-Chip Memories

    Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknik

    Författare :Xiao Luo; Masoud Nouripayam; [2017]
    Nyckelord :BIST SRAM verification test self-test dual-port ASIC; Technology and Engineering;

    Sammanfattning : The ability of testing on-chip circuitry is extremely essential to ASIC implemen- tations today. However, providing functional tests and verification for on-chip (embedded) memories always poses a huge number of challenges to the designer. LÄS MER