Sökning: "BIST SRAM verification test self-test dual-port ASIC"
Hittade 1 uppsats innehållade orden BIST SRAM verification test self-test dual-port ASIC.
1. Integration of a Digital Built-in Self-Test for On-Chip Memories
Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknikSammanfattning : The ability of testing on-chip circuitry is extremely essential to ASIC implemen- tations today. However, providing functional tests and verification for on-chip (embedded) memories always poses a huge number of challenges to the designer. LÄS MER
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