Sökning: "Defect-Based Testing"
Hittade 1 uppsats innehållade orden Defect-Based Testing.
1. Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Uppsats för yrkesexamina på grundnivå, Institutionen för datavetenskapSammanfattning : NXP Semiconductors (formerly Philips Semiconductors) has created a new embedded asynchronous FIFO module. It is a small and fast full-custom design with Design-for-Test (DfT) functionality. The fault detection qualities of a proposed manufacturing test for this FIFO have been analyzed by a defect-based method based on analog simulation. LÄS MER
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