Sökning: "EUV Lithography"
Hittade 2 uppsatser innehållade orden EUV Lithography.
1. Synchrotrons as a Source for Soft X-Ray Lithography
Master-uppsats, Lunds universitet/Synkrotronljusfysik; Lunds universitet/Fysiska institutionenSammanfattning : To move to lower modes in extreme ultra-violet lithography (EUVL) technology (and keep up with Moore’s law), new sources of soft X-ray radiation must be developed. It is clear from previous studies that Free Electron Lasers (FELs) can easily meet the in-band power requirements at these lower wavelength modes, however detailed studies for insertion devices (undulators) as a soft X-ray lithography (SXL) source are due for a re-evaluation. LÄS MER
2. Offline study of next generation EUV pellicle materials and performances : From experimental design to material characterization
Master-uppsats, KTH/Skolan för elektroteknik och datavetenskap (EECS)Sammanfattning : Lithography is the most crucial step in the semiconductor microfabrication workflow. Continuous features size shrinking co-occurs with the reduction of the exposure wavelength: a move from 193 nm light to extreme ultra-violet (EUV) at 13.5 nm is performed. The change poses a vast number of challenges that have been overcome in the past years. LÄS MER