Sökning: "IEEE Standard 1241"

Hittade 1 uppsats innehållade orden IEEE Standard 1241.

  1. 1. Built-in self-test of analog-to-digital converters in FPGAs

    Master-uppsats, Linköpings universitet/Elektroniksystem

    Författare :Petter Nilsson; [2014]
    Nyckelord :FPGA; BIST; ADC; dynamic test; static test; linearity; DNL; INL; offset; gain error; FFT; SNR; THD; delta-sigma; sigma-delta; DAC; high-level synthesis; HLS; IEEE Standard 1241;

    Sammanfattning : When designing an ADC it is desirable to test its performance at two different points in the development process. The first is characterization and verification testing when a chip containing the ADC has been taped-out for the first time, and the second is production testing when the chip is manufactured in large scale. LÄS MER