Sökning: "Mueller matrix"
Visar resultat 1 - 5 av 6 uppsatser innehållade orden Mueller matrix.
1. An Investigation of the Polarizing Properties and Structural Characteristics in theCuticles of the Scarab Beetles Chrysina gloriosa and Cetonia aurata
Master-uppsats, Institutionen för fysik, kemi och biologi; Tekniska högskolanSammanfattning : Light reflected from the scarab beetles Cetonia aurata (C. aurata) and Chrysina gloriosa (C. gloriosa) has left-handed polarization. LÄS MER
2. An Investigation of the Polarization States of Light Reflected from Scarab Beetles of the Chrysina Genus
Kandidat-uppsats, Tillämpad optikSammanfattning : The polarization behaviour for six species of Scarab beetles from the Chrysina genus is investigated with Mueller Matrix Spectroscopic Ellipsometer (MMSE). The m41 element of the matrix, which is related to the circular polarization behaviour, is analysed. LÄS MER
3. Optical Studies and Micro-Structure Modeling of the Circular-Polarizing Scarab Beetles Cetonia aurata, Potosia cuprea, Liocola marmorata
Kandidat-uppsats, Tillämpad optikSammanfattning : The aim of the work presented in this thesis is to contribute to a fundamental understanding of polarizing phenomena in some scarab beetles. The aim is also to study the beetle structures as inspiration in fabrication of artificially sculptured films. LÄS MER
4. Optical Studies ofNano-Structures in the BeetleCetonia Aurata
Master-uppsats, Institutionen för fysik, kemi och biologiSammanfattning : The main objective of this thesis is to study the polarization effects of the beetle Cetonia aurata using Mueller-matrix ellipsometry. The outer shell of the beetle consists of complex microstructures which control the polarization of the reflected light. It has metallic appearance which originates from helicoidal structures. LÄS MER
5. Mueller matrix ellipsometry on advanced nanostructures
Uppsats för yrkesexamina på grundnivå, Institutionen för fysik, kemi och biologiSammanfattning : Ellipsometry is an optical technique used for studies of thin films and surfaces. The technique is based on measurement and analysis of the changes in the state of polarization that occur when polarized light is reflected on a sample surface. The multichannel Mueller matrix ellipsometer is a new system that is about to enter the commercial market. LÄS MER