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Hittade 2 uppsatser som matchar ovanstående sökkriterier.

1. 1. Equipment for measuring cosmic-ray effects on DRAM

   Magister-uppsats, Institutionen för systemteknik

   Författare :Per-Axel Jonsson; [2007]
   Nyckelord :DRAM; memory; SEU; single event upset; soft error; FPGA; cosmic radiation;

   Sammanfattning : Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. LÄS MER

3. 2. Simulated Annealing : implementering mot integrerade analoga kretsar

   Uppsats för yrkesexamina på grundnivå, Institutionen för systemteknik

   Författare :Per-Axel Jonsson; [2004]
   Nyckelord :Electronics; Simulated Annealing; optimering; optimeringsmetod; tvåstegsförstärkare; integrerade analoga kretsar; Elektronik;

   Sammanfattning : Today electronics becomes more and more complex and to keep low costs and power consumption, both digital and analog parts are implemented on the same chip. The degree of automization for the digital parts have increased fast and is high, but for the analog parts this has not come through. LÄS MER