Sökning: "Rasmus Ahlbäck"
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1. Elevated temperature tests of SiC experiment for MIST : KTH Student Satellite MIST
Master-uppsats, KTH/Skolan för elektroteknik och datavetenskap (EECS)Sammanfattning : Electronics today rely heavily on silicon transistors which are unsuitable for extreme environments where temperatures potentially could reach up to 500◦C. Materials other than silicon has been proposed to solve this problem, one of which is silicon carbide. LÄS MER
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