Sökning: "Tobias Dubois"

Hittade 1 uppsats innehållade orden Tobias Dubois.

  1. 1. Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO

    Uppsats för yrkesexamina på grundnivå, Institutionen för datavetenskap

    Författare :Tobias Dubois; [2007]
    Nyckelord :FIFO Testing; FIFO; Testing; Defect-Based Testing; Electronics;

    Sammanfattning : NXP Semiconductors (formerly Philips Semiconductors) has created a new embedded asynchronous FIFO module. It is a small and fast full-custom design with Design-for-Test (DfT) functionality. The fault detection qualities of a proposed manufacturing test for this FIFO have been analyzed by a defect-based method based on analog simulation. LÄS MER