Sökning: "concatenation of test patterns"

Hittade 2 uppsatser innehållade orden concatenation of test patterns.

1. 1. Noise Reduction in Flash X-ray Imaging Using Deep Learning

   Uppsats för yrkesexamina på avancerad nivå, Uppsala universitet/Avdelningen för beräkningsvetenskap

   Författare :Tobias Sundman; [2018]
   Nyckelord :flash x-ray imaging; machine learning; deep learning; neural network; locally connected layer; autoencoder; LCLS; GPU; tensorflow; python; U-Net; free electron laser; selu; scaled exponential linear unit; diffraction; simulation; residual; concatenation;

   Sammanfattning : Recent improvements in deep learning architectures, combined with the strength of modern computing hardware such as graphics processing units, has lead to significant results in the field of image analysis. In this thesis work, locally connected architectures are employed to reduce noise in flash X-ray diffraction images. LÄS MER

3. 2. Minimizing memory requirements for deterministic test data in embedded testing

   M1-uppsats, Institutionen för datavetenskap; Tekniska högskolan

   Författare :Daniel Ahlström; [2010]
   Nyckelord :deterministic test patterns; deterministic test data; embedded testing; minimizing memory; boundary scan; multiple components; components of same type; duplication of test data; jtag; ieee 1149; concatenator; concatenation of test patterns;

   Sammanfattning : Embedded and automated tests reduce maintenance costs for embedded systems installed in remote locations. Testing multiple components of an embedded system, connected on a scan chain, using deterministic test patterns stored in a system provide high fault coverage but require large system memory. LÄS MER