Sökning: "ieee 1149"

Visar resultat 1 - 5 av 8 uppsatser innehållade orden ieee 1149.

1. 1. Test and Repair of Reconfigurable On-chip Instrument Access Networks

   Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknik

   Författare :Zehang Xiang; [2019]
   Nyckelord :reconfigurable network; Test and repair of reconfigurable scan network; scan register; Technology and Engineering;

   Sammanfattning : As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become harder to avoid malfunctioning. Embedded instruments are increasingly used to test, tune, and configure the transistors in ICs. IEEE Std.1149. LÄS MER

3. 2. Reconfigurable Instrument Access Network with a Functional Port Interface

   Master-uppsats, Lunds universitet/Institutionen för elektro- och informationsteknik

   Författare :Gani Kumisbek; Prathamesh Murali; [2019]
   Nyckelord :IEEE Std. 1687; IJTAG; UART.; Technology and Engineering;

   Sammanfattning : The ever-increasing need for higher performance and more complex functionality pushes the electronics industry to find a faster and more efficient way to test and debug an Integrated Circuit (IC). Currently, the IEEE Std. 1149.1, known as Joint Test Action Group (JTAG) is considered as state of the art by the industry. LÄS MER

4. 3. Test Scheduling with Power and Resource Constraints for IEEE P1687

   Master-uppsats, Institutionen för datavetenskap; Tekniska högskolan

   Författare :Golnaz Asani; [2012]
   Nyckelord :IJTAG; IEEE P1687; Test Time Calculation; Test Scheduling; Resource Constraints; Power Constraints;

   Sammanfattning : IEEE P1687 (IJTAG) is proposed to add more exibility|compared with IEEE 1149.1 JTAG|for accessing on-chip embedded test features called instruments. This exibility makes it possible to include and exclude instruments from the scan path. To reach a minimal test time, all instruments should be accessed concurrently. LÄS MER

5. 4. Design of an in-field Embedded Test Controller

   Master-uppsats, ESLAB - Laboratoriet för inbyggda system

   Författare :Ghafoor Shah; Saad Arslan; [2011]
   Nyckelord :in-field testing; embedded testing; automated in-field diagnosis;

   Sammanfattning : Electronic systems installed in their operation environments often require regular testing. The nanometer transistor size in new IC design technologies makes the electronic systems more vulnerable to defects. Due to certain reasons like wear out or over heating and difficulty to access systems in remote areas, in-field testing is vital. LÄS MER

7. 5. Minimizing memory requirements for deterministic test data in embedded testing

   M1-uppsats, Institutionen för datavetenskap; Tekniska högskolan

   Författare :Daniel Ahlström; [2010]
   Nyckelord :deterministic test patterns; deterministic test data; embedded testing; minimizing memory; boundary scan; multiple components; components of same type; duplication of test data; jtag; ieee 1149; concatenator; concatenation of test patterns;

   Sammanfattning : Embedded and automated tests reduce maintenance costs for embedded systems installed in remote locations. Testing multiple components of an embedded system, connected on a scan chain, using deterministic test patterns stored in a system provide high fault coverage but require large system memory. LÄS MER