Graphical User Interface for Intermodulation Atomic Force Microscopyok.

Sammanfattning: In atomic force microscopy (AFM) a cantilever, with a sharp tip attached to its free end, is scanned over a surface. Forces from the surface aect the tip causing cantilever deection, which is registered by a detector. This information is then used to create a topographical image of the surface on nanoscale. We were a part of a project that developed a new type of AFM, namely intermodulation atomic force microscopy (IMAFM). It is based on dynamic AFM, but instead of one drive frequency, two or more frequencies are used. This generates more information from the sample. Our part in this project was to improve the software already in use. This will facilitate future simulations and experiments; and also utilize the available information in a new way.