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1. Graphical User Interface for Intermodulation Atomic Force Microscopyok.
Kandidat-uppsats, KTH/Tillämpad fysik; KTH/Skolan för teknik och hälsa (STH)Sammanfattning : In atomic force microscopy (AFM) a cantilever, with a sharp tip attached to its free end, is scanned over a surface. Forces from the surface aect the tip causing cantilever deection, which is registered by a detector. This information is then used to create a topographical image of the surface on nanoscale. LÄS MER
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