Sökning: "IEEE P1687"

Hittade 2 uppsatser innehållade orden IEEE P1687.

1. 1. Test Scheduling with Power and Resource Constraints for IEEE P1687

   Master-uppsats, Institutionen för datavetenskap; Tekniska högskolan

   Författare :Golnaz Asani; [2012]
   Nyckelord :IJTAG; IEEE P1687; Test Time Calculation; Test Scheduling; Resource Constraints; Power Constraints;

   Sammanfattning : IEEE P1687 (IJTAG) is proposed to add more exibility|compared with IEEE 1149.1 JTAG|for accessing on-chip embedded test features called instruments. This exibility makes it possible to include and exclude instruments from the scan path. To reach a minimal test time, all instruments should be accessed concurrently. LÄS MER

3. 2. Analysis and Optimization for Testing Using IEEE P1687

   Uppsats för yrkesexamina på avancerad nivå, ESLAB - Laboratoriet för inbyggda system

   Författare :Farrokh Ghani Zadegan; [2010]
   Nyckelord :IEEE P1687; IJTAG; Test Architecures; Test Time Calculation; Design Automation; Test Time Optimization;

   Sammanfattning :  The IEEE P1687 (IJTAG) standard proposal aims at providing a standardized interface between on-chip embedded test, debug and monitoring logic (instruments), such as scan-chains and temperature sensors, and the Test Access Port of IEEE Standard 1149.1 mainly used for board test. LÄS MER