Sökning: "Kantilever"

Hittade 3 uppsatser innehållade ordet Kantilever.

  1. 1. Difference in Marginal Bone Loss Around Implants Between ShortImplant-Supported Partial Fixed Prostheses With and Without Cantilever : A Retrospective Clinical Study

    Master-uppsats, Malmö universitet/Odontologiska fakulteten (OD)

    Författare :Josef Al-Kilani; Sedef Al-Kilani; [2023]
    Nyckelord :Implant-supported fixed partial prosthesis; cantilever; marginal bone loss;

    Sammanfattning : Abstract  Objective:The aim of this retrospective study was to examine the influence of a cantilever on marginal bone loss (MBL) around dental implants supporting 3-unit partial fixed prostheses.  Materials and methods:Retrospective data were collected from dental records of patients at a specialist clinic in Malmö, Sweden, covering the period from 1980 to 2018. LÄS MER

  2. 2. Enhancing Sensing in Nanoscale: Investigation of Smart Nanomechanical Cantilever Array

    Master-uppsats, KTH/Skolan för kemi, bioteknologi och hälsa (CBH)

    Författare :Hiruy Michael Weldegiorgish; [2022]
    Nyckelord :Cantilever; AFM; Biosensor; Piezoresistive sensor; Piezoelectric actuator; Kantilever; AFM; Biosensor; Piezo -resistorer; Piezo-elektiska pådrivare;

    Sammanfattning : In this report, a novel smart nanocantilever with self-deflection sensor using embedded piezo-resistor and self-actuation using integrated piezo-electric actuator is proposed, designed and simulated to enable highly sensitive label free biosensor and ultra-short cantilever probe for AFM applications. The smart nanocantilever comprises of a triangular Si3N4 nanocantilever (10µm long, 400nm width and 100nm thickness) connected to a multi-layer support structure (Si3N4 (100nm)/PZT (100nm)) having n-type silicon piezo resistor (7µm long ,2µm width and 20nm thickness) embedded in the Si3N4 layer in both the support structure and nanocantilever. LÄS MER

  3. 3. Graphical User Interface for Intermodulation Atomic Force Microscopyok.

    Kandidat-uppsats, KTH/Tillämpad fysik; KTH/Skolan för teknik och hälsa (STH)

    Författare :Malin Borg; Elias Ghattas; Ardian Syla; [2011]
    Nyckelord :;

    Sammanfattning : In atomic force microscopy (AFM) a cantilever, with a sharp tip attached to its free end, is scanned over a surface. Forces from the surface aect the tip causing cantilever deection, which is registered by a detector. This information is then used to create a topographical image of the surface on nanoscale. LÄS MER