Sökning: "cosmic radiation"
Visar resultat 21 - 25 av 26 uppsatser innehållade orden cosmic radiation.
21. Simulation of the Heavy Ion Contribution to the Radiation Environment onboard the International Space Station
Kandidat-uppsats, KTH/FysikSammanfattning : The health risks from exposure to the space radiation environment makes it important to have reliable simulation models for the radiation doses inside spacecrafts. Simulations of the heavy ion parts, especially iron, of the Galactic Cosmic Ray (GCR) radiation has been carried out using the simulation software Geant4 with geometry models from the DESIRE project. LÄS MER
22. Atmospheric Radiation Effects Study on Avionics : An Analysis of NFF Errors
Master-uppsats, Programvara och system; Tekniska högskolanSammanfattning : No fault found (NFF) errors, i.e. errors which origin has not been established, irregularly occur in electronic devices. The actual cause of such errors varies but one, possibly more prominent, source for these soft errors is atmospheric radiation. LÄS MER
23. COMPARISON AND EVALUATION OF HARDWARE MODELLING AND SIMULATION TOOLS
Master-uppsats, JTH, Data- och elektroteknikSammanfattning : Avionics Division of Saab AB develops advanced electronics that need to be robust and work in harsh environments with for example extreme temperatures and cosmic radiation without any failure. To succeed with this the electronics need to be simulated and tested. LÄS MER
24. Vidareutveckling av provplattform för mätning av kosmisk strålnings inverkan på DRAM
Master-uppsats, Blekinge Tekniska Högskola/Avdelningen för signalbehandlingSammanfattning : Sammanfattning: SAAB Communication i Linköping sysslar med konsultverksamhet mot ett flertal nationella och internationella företag inom både den civila och militära sektorn. Fokus ligger på flyget med uppdrag inom telesystem, radiosystem, signaturanpassning, EMC, atmosfärisk påverkan mm. LÄS MER
25. Equipment for measuring cosmic-ray effects on DRAM
Magister-uppsats, Institutionen för systemteknikSammanfattning : Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. LÄS MER