Sökning: "Scanning Tunneling Spectroscopy"
Visar resultat 1 - 5 av 19 uppsatser innehållade orden Scanning Tunneling Spectroscopy.
1. Characterization of Bi-incorporated InSb(111)A/B Surfaces : An STM and XPS Study
Master-uppsats, Lunds universitet/Synkrotronljusfysik; Lunds universitet/Fysiska institutionenSammanfattning : In recent years, III-V semiconductor materials have received increasing attention due to their admirable electronic properties like direct tunable bandgaps and high charge carrier mobility. Indium Antimonide (InSb) possesses the largest electron mobility among III-V materials and is promising for infrared detectors, high-speed field effect transistors, and spintronics. LÄS MER
2. Ultra-Thin Ag Films on the Sn/Si(111)-√3×√3 Surface Studied by STM
Master-uppsats, Karlstads universitet/Institutionen för ingenjörsvetenskap och fysik (from 2013)Sammanfattning : The growth of atomically flat silver films on Si(111) usually requires a two-step growth, including deposition at low temperature (≈100 K) followed by slowly annealing to room temperature. In addition, flat silver films are usually only obtained on Si(111) for film thicknesses larger than the critical thickness of 6 monolayer. LÄS MER
3. Using gallium nitride nanowires as STM probes
Kandidat-uppsats, Lunds universitet/Synkrotronljusfysik; Lunds universitet/Fysiska institutionenSammanfattning : Gallium nitride (GaN) nanowires grown using catalyst-free metal organic vapor phase epitaxy were used as scanning tunneling microscope (STM) probes. The probes were prepared by placing a GaN nanowire on a tungsten STM probe using a nanomanipulator in a scanning electron microscope (SEM) and welding them together using an electron beam induced platinum deposition. LÄS MER
4. InAs and high-k oxides, a scanning tunnelling study of their interfaces
Kandidat-uppsats, Lunds universitet/Synkrotronljusfysik; Lunds universitet/Fysiska institutionenSammanfattning : In order for semiconductor materials to be suitable for implementation in new and progressive devices they have to be of better electronic characteristics than currently used materials, and maintain these once treated and put into action. It is important to verify that bulk characteristics are not hindered at the surface when a given semiconductor is put in contact with another material due to necessity. LÄS MER
5. GaN-nanowire as probe for scanning tunneling microscopy
Kandidat-uppsats, Lunds universitet/Synkrotronljusfysik; Lunds universitet/Fysiska institutionenSammanfattning : Scanning tunneling microscope (STM) has in recent years been one of the most used microscopy approaches in surface science. The STM probe allows for the investigation of atomic resolution electrical properties of a material, these probes are usually of metallic characters. LÄS MER